FEI COMPANY TOOLS FOR N ANOTECH (DEVICE)
FEI COMPANY

[Class - 41]

TRAINING IN THE OPERATION OF COMPONENTS OF EQUIPMENT AND MICRO-MACHINING EQUIPMENT AND ACCESSORIES FOR THE MANUFACTURE OF SEMI-CONDUCTORS AND DATA STORAGE COMPONENTS, MICROSCOPES, SCANNING ELECTRON MICROSCOPES, SCANNING ION MICROSCOPES, FOCUSED ION BEAM TOOLS, SECONDARY ION MASS SPECTROMETRY SYSTEMS, ATOMIC-FORCE MICROSCOPES AND TRANSMISSION ELECTRON MICROSCOPES INCLUDED IN CLASS 41.

[Class - 37]

REPAIR AND MAINTENANCE OF COMPONENTS OF EQUIPMENT AND MICRO-MACHINING EQUIPMENT AND ACCESSORIES FOR THE MANUFACTURE OF SEMI-CONDUCTORS AND DATA STORAGE COMPONENTS, MICROSCOPES, SCANNING ELECTRON MICROSCOPES, SCANNING ION MICROSCOPES, FOCUSED ION BEAM TOOLS, SECONDARY ION MASS SPECTROMETRY SYSTEMS, ATOMIC-FORCE MICROSCOPES AND TRANSMISSION ELECTRON MICROSCOPES, POST-WARRANTY REPAIR AND MAINTENANCE OF COMPONENTS OF EQUIPMENT AND MICRO-MACHINING EQUIPMENT AND ACCESSORIES FOR THE MANUFACTURE OF SEMI-CONDUCTORS AN DATA STORAGE COMPONENTS, MICROSCOPES, SCANNING ELECTRON MICROSCOPES, SCANNING ION MICROSCOPES, FOCUSED ION BEAM TOOLS, SECONDARY ION MASS SPECTROMETRY SYSTEMS, ATOMIC-FORCE MICROSCOPES AND TRANSMISSION ELECTRON MICROSCOPES INCLUDED IN CLASS 37.

[Class - 9]

MICROSCOPES, SCANNING ELECTRON MICROSCOPES, SCANNING ION MICROSCOPES, FOCUSED ION BEAM TOOLS, SECONDARY ION MASS SPECTROMETRY SYSTEMS, ATOMIC-FORCE MICROSCOPES AND TRANSMISSION ELECTRON MICROSCOPES, MICROSCOPIC SYSTEM NAVIGATIONAL SOFTWARE, NAMELY SOFTWARE THAT VISUALLY ENHANCES THE NAVIGATIONAL, FUNCTIONAL CAPABILITY OF SPECTROSCOPIC, LITHOGRAPHIC AND MICROSCOPIC COMPONENTS, APPLICATION SOFTWARE AND OPERATION SYSTEM SOFTWARE FOR OPERATION OF ALL THE FOREGOING EQUIPMENT, NAMELY, SOFTWARE FOR USE IN MICROSCOPIC IMAGING, MILLING AND ANALYSIS, COMPUTER SOFTWARE FOR MANUFACTURING SEMI-CONDUCTORS, COMPUTER SOFTWARE FOR MANUFACTURING DATA STORAGE COMPONENTS AND COMPUTER SOFTWARE FOR MANUFACTURING MICRO-MACHINERY INCLUDED IN CLASS 9.

[Class - 42]

INDUSTRIAL MANUFACTURE PROCESSES, NAMELY MICROSCOPIC IMAGING, ANALYSIS AND CUTTING, IN THE FIELDS OF SEMICONDUCTOR MANUFACTURE, DATA STORAGE EQUIPMENT MANUFACTURE, SCIENTIFIC RESEARCH, MANUFACTURE OF DEVICES WITH SUB-MICRON FEATURES AND BIOLOGICAL SCIENCES, COMPUTER SOFTWARE SUPPORT SERVICES, NAMELY, TROUBLE SHOOTING OF COMPUTER SOFTWARE PROBLEMS, PROVIDING BACK UP FOR COMPUTER SOFTWARE PROGRAMS, COMPUTER SOFTWARE CONSULTATION SERVICES, DESIGN AND UPDATING OF COMPUTER SOFTWARE, PROJECT MANAGEMENT RELATING TO COMPUTER SOFTWARE, COMPUTER SOFTWARE INSTALLATION AND MAINTENANCE, PROVIDING INFORMATION AN DEVICE RELATING TO COMPUTER SOFTWARE INCLUDED IN CLASS 42.