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6128247
Sept 28, 2023
FAAST Fast Advanced Array Systems Technology is a DEVICE Trademark filed on Sept 28, 2023 in HARYANA through United States of America IP Office.The Trademark is registered to ADVANCED OEM SOLUTIONS, LLC and was filed by CHADHA AND CHADHA[6600].
Application ID
6128247
Status
Objected
Date of Application
Sept 28, 2023
Classes
9, 42
Proprietor(s)
ADVANCED OEM SOLUTIONS, LLC
Attorney
CHADHA AND CHADHA[6600]
Emaar Digital Greens, Tower B, 15th floor, Unit no. 9 and 10, Golf Course Extension Road, Sector - 61, Gurugram, Haryana 122011, India
Type
DEVICE
Registration State
HARYANA
Country
United States of America
IP Office
DELHI
Used Since
Proposed to be used
Details
[Class - 9]
Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signaling, checking, life-saving and teaching apparatus and instruments in the nature of electronic enclosures, probes in the nature of ultrasound probe not for medical use and sensors in the nature of sensor chips for scientific use and of Ultrasonic sensors for non-destructive testing applications; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling the distribution or use of electricity; apparatus for recording, transmission or reproduction of sound or images in the nature of ultrasonic transmission machines; magnetic recording media in the nature of blank sound recording disks; Blank compact discs, blank recordable DVDs and other digital recording media in the nature of digital video recorders; mechanisms for coin-operated apparatus; cash registers, calculating machines, data processing equipment, computers; Downloadable software for data processing and for non-destructive testing inspections and signal image processing; Fire extinguishers; components, sub-systems and equipment for non-destructive testing systems and instruments, particularly by ultrasounds, monoprobes, multi-probes or phase network probes, eddy current probes, for the detection of defects, measuring and maintenance in the nature of capacitors, filers, connectors, oscillators, relays, switches, transformers, resistors, semiconductors, integrated circuits and Field-programmable gate array; all of the foregoing being used in the field of non-destructive testing application.