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CRITICAL DIAGNOSTICS & Butterfly Design with ASPECT PLUS Tester
(1) CRITICAL DIAGNOSTICS LIMITEDBody Incorporate
CRITICAL DIAGNOSTICS & Butterfly Design with ASPECT PLUS Tester is a Trademark filed on Jul 12, 2016 in through IP Office.The Trademark is registered to (1) CRITICAL DIAGNOSTICS LIMITEDBody Incorporate and was filed by attorney.
CRITICAL DIAGNOSTICS & Butterfly Design with ASPECT PLUS Tester (1) CRITICAL DIAGNOSTICS LIMITEDBody Incorporate Trademark Information
Application ID
3307330
Status
Registered
Date of Application
Jul 12, 2016
Classes
5, 10
Proprietor(s)
(1) CRITICAL DIAGNOSTICS LIMITEDBody Incorporate
Valid/Upto
12/07/2026
Details
[Class - 10]
Medical apparatus and instruments; diagnostic apparatus and instruments for medical purposes; diagnostic apparatus and instruments for in vitro use; medical diagnostic apparatus for the analysis of body fluids; diagnostic test kits (apparatus and instruments) for use in disease testing; diagnostic test kits (apparatus and instruments) containing antibodies, reagents, cassettes, and biological filters for use in disease testing; parts and fittings for all the aforesaid goods.
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